The performance of Glass GEM

被引:18
作者
Fujiwara, T. [1 ]
Mitsuya, Y. [2 ]
Takahashi, H. [2 ]
Fushie, T. [3 ]
Kishimito, S. [4 ]
Guerard, B. [5 ]
Uesaka, M. [1 ]
机构
[1] Univ Tokyo, Sch Engn, Nuclear Profess Sch, Tokai, Ibaraki 3191188, Japan
[2] Univ Tokyo, Sch Engn, Bunkyo Ku, Tokai, Ibaraki 3191188, Japan
[3] HOYA Corp, Blanks Div, Mashiko, Tochigi 3214292, Japan
[4] High Energy Accelerator Org, Ibaraki 3050801, Japan
[5] Inst Max Von Laue Paul Langevin, F-38042 Grenoble 9, France
关键词
Gaseous detectors; Micropattern gaseous detectors (MSGC; GEM; THGEM; RETHGEM; MHSP; MICROPIC; MICROMEGAS; InGrid; etc); Electron multipliers (gas); MICROSTRIP GAS-CHAMBERS; OPERATION;
D O I
10.1088/1748-0221/9/11/P11007
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Here we report the performance of Glass gas electron multipliers (Glass GEMs), which were fabricated with photo-etchable glass. The photo-etchable glass used for substrate is called PEG3 (Hoya Corporation). With this material, we succeeded in fabricating a Glass GEM that was 680-mu m-thick with a hole diameter of 170-mu m and Cr and Cu layer electrodes. A Glass GEM has advantages such as good uniformity, high gain, a flat surface without stretching, cylindrical holes, and the absence of outgassing from the material. We successfully operated a Glass GEM having 100 x 100 mm(2) effective area with various gas mixtures. The energy resolution for 5.9 keV X-rays was 18%, obtained by uniform irradiation of the entire effective area. The gas gain of the Glass GEM reached up to 90,000 with a gas mixture of Ne/CF4 (90:10). The Glass GEM was also operated with Ar/CH4 and Ar/CF4 gas. The gain stability measured for Glass GEM showed no significant increase or decrease as a function of elapsed time from applying high voltage. The gain stability over 15 hours of operation was about 10% in high-count-rate irradiation. Gain mapping across the Glass GEM showed good uniformity with a standard deviation of about 10%.
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页数:9
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