Liquid crystal display defects in multiple backgrounds with visual real-time detection

被引:12
作者
Cui, Yu [1 ]
Wang, Sen [1 ]
Wu, Haibo [1 ]
Xiong, Binzhou [1 ]
Pan, Yunlong [1 ]
机构
[1] Kunming Univ Sci & Technol, Fac Mech & Elect Engn, Kunming 650000, Yunnan, Peoples R China
基金
中国国家自然科学基金;
关键词
defect detection; edge detection; image segmentation; LCD; visual real‐ time detection; AUTOMATED OPTICAL INSPECTION; MURA; DESIGN;
D O I
10.1002/jsid.997
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
There are kinds of defects that may appear in the process of Liquid Crystal Display (LCD) manufacturing, which cannot be effectively detected, owing to the uneven illumination, low contrast, and miscellaneous patterns of defects. To improve the efficiency of defect detection and ensure the quality of LCD, three visual real-time detection methods are adopted for detecting six different defects in multiple backgrounds, where image preprocessing methods are used to highlight the defects and facilitate the segmentation and detection. Specifically, the interclass variance (OTSU) method is used to segment and mark Liquid Crystal Display (LCD) Mura and scratch defects in six kinds of solid color backgrounds; the method and the connectivity-4 judgment criteria are adopted to label edge defects in grid display background; the gray mean and standard deviation of the segmented subregions are calculated to recognize the color gradation defect in the 32-level gradation display background. Experimental results show that LCD Mura defects and scratches can be segmented more completely by the proposed method compared with the benchmark methods, and the edge defects can be identified accurately by the OTSU-based method and particle-based morphological processing with grids as the detection background, and the color gradation can also be recognized with the 32-level gray gradation as the background.
引用
收藏
页码:547 / 560
页数:14
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