Ultrafast electron microscopy captures nanoscale phase changes

被引：0
作者：
Sealy, Cordelia
机构：
来源：
NANO TODAY | 2021年 / 37卷
关键词：
D O I：
10.1016/j.nantod.2021.101113
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页数：2
相关论文
共 50 条
  • [41] Atomic force microscopy (AFM), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) of nanoscale plate-shaped second phase particles
    Sobchenko, I.
    Pesicka, J.
    Baither, D.
    Stracke, W.
    Pretorius, T.
    Chi, L.
    Reichelt, R.
    Nembach, E.
    PHILOSOPHICAL MAGAZINE, 2007, 87 (16-17) : 2427 - 2460
  • [42] Ultrafast Electron Microscopy: An Instrument of the XXI Century
    Aseev, S. A.
    Mironov, B. N.
    Ryabov, E. A.
    Avilov, A. S.
    Girichev, G. V.
    Ischenko, A. A.
    CRYSTALLOGRAPHY REPORTS, 2021, 66 (04) : 553 - 569
  • [43] Development and applications of ultrafast transmission electron microscopy
    Shimojima, T.
    Nakamura, A.
    Ishizaka, K.
    MICROSCOPY, 2023, 72 (04) : 287 - 298
  • [44] Ultrafast Electron Microscopy: An Instrument of the XXI Century
    S. A. Aseev
    B. N. Mironov
    E. A. Ryabov
    A. S. Avilov
    G. V. Girichev
    A. A. Ischenko
    Crystallography Reports, 2021, 66 : 553 - 569
  • [45] Ultrafast electron microscopy for probing magnetic dynamics
    Harvey, Tyler R.
    Rubiano da Silva, Nara
    Gaida, John H.
    Moeller, Marcel
    Feist, Armin
    Schaefer, Sascha
    Ropers, Claus
    MRS BULLETIN, 2021, 46 (08) : 711 - 719
  • [46] Applications of Ultrafast Photoemission Electron Microscopy in Nanophotonics
    不详
    CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG, 2019, 46 (05):
  • [47] Applications of Ultrafast Photoemission Electron Microscopy in Nanophotonics
    Sun Q.
    Zu S.
    Kosei U.
    Gong Q.
    Hiroaki M.
    Zhongguo Jiguang/Chinese Journal of Lasers, 2019, 46 (05):
  • [48] Ultrafast electron microscopy for probing magnetic dynamics
    Tyler R. Harvey
    Nara Rubiano da Silva
    John H. Gaida
    Marcel Möller
    Armin Feist
    Sascha Schäfer
    Claus Ropers
    MRS Bulletin, 2021, 46 : 711 - 719
  • [49] Four-dimensional ultrafast electron microscopy
    Lobastov, VA
    Srinivasan, R
    Zewail, AH
    PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2005, 102 (20) : 7069 - 7073
  • [50] Ultrafast electron microscopy integrated with a direct electron detection camera
    Lee, Young Min
    Kim, Young Jae
    Kim, Ye-Jin
    Kwon, Oh-Hoon
    STRUCTURAL DYNAMICS-US, 2017, 4 (04):
12345