Depth-resolved Laue microdiffraction with coded apertures

被引:5
作者
Gursoy, Doga [1 ]
Sheyfer, Dina [1 ]
Wojcik, Michael [1 ]
Liu, Wenjun [1 ]
Tischler, Jonathan Z. [1 ]
机构
[1] Argonne Natl Lab, Xray Sci Div, 9700 South Cass Ave, Lemont, IL 60439 USA
来源
JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2022年 / 55卷
关键词
X-ray diffraction; Laue microscopy; coded sensing; DIFFRACTION; MICROSCOPY;
D O I
10.1107/S1600576722007099
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
A rapid data acquisition and reconstruction method is introduced to image the crystalline structure of materials and the associated strain and orientations at micrometre resolution using Laue diffraction. The method relies on scanning a coded aperture across the diffracted X-ray beam from broadband illumination and a reconstruction algorithm to resolve Laue microdiffraction patterns as a function of depth along the incident illumination path. It provides rapid access to full diffraction information for sub-micrometre volume elements in bulk materials. Both the theory and the experimental validation of this imaging approach are presented.
引用
收藏
页码:1104 / 1110
页数:7
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