Influence of overlapped sustain waveform on panel-aging characteristics based on MgO surface morphology variation in alternating-current plasma display panel
被引:2
|
作者:
Park, Choon-Sang
论文数: 0引用数: 0
h-index: 0
机构:
Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South Korea
Park, Choon-Sang
[1
]
Kim, Dong Ha
论文数: 0引用数: 0
h-index: 0
机构:
Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South Korea
Kim, Dong Ha
[1
]
Kim, Jae Hyun
论文数: 0引用数: 0
h-index: 0
机构:
Korea Atom Energy Res Inst, Radiat Instrumentat Res Div, Daejeon, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South Korea
Kim, Jae Hyun
[2
]
Shin, Bhum Jae
论文数: 0引用数: 0
h-index: 0
机构:
Sejong Univ, Dept Elect Engn, Seoul, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South Korea
Shin, Bhum Jae
[3
]
Tae, Heung-Sik
论文数: 0引用数: 0
h-index: 0
机构:
Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South Korea
Tae, Heung-Sik
[1
]
机构:
[1] Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Daegu, South Korea
[2] Korea Atom Energy Res Inst, Radiat Instrumentat Res Div, Daejeon, South Korea
[3] Sejong Univ, Dept Elect Engn, Seoul, South Korea
Overlapped sustain waveform;
plasma discharge;
panel-aging;
wall voltage variation;
surface morphology;
MgO thin film;
scanning electron microscope (SEM);
three-dimensional IR emission;
plasma display panel;
XE CONTENT;
DISCHARGE;
EMISSION;
PERIOD;
PDP;
D O I:
10.1080/15421406.2016.1277477
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
This paper has been investigated the changes in the discharge characteristics and surface morphology of the MgO surface on both the indium thin oxide (ITO) and bus electrodes when the conventional (non-overlapped) and overlapped sustain waveforms are applied during the panel-aging process in alternating-current plasma display panel. For conventional sustain waveform, the strong surface discharge is confined within the ITO electrode, whereas for overlapped sustain waveform, the strong surface discharge is produced and spread toward the end of the bus electrode as well as the ITO electrode. It is demonstrated that the overlapped sustain waveform is a very effective aging waveform that can obtain the uniform surface morphology of the MgO thin film on both the ITO and bus electrodes.
机构:
Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
Park, Choon-Sang
论文数: 引用数:
h-index:
机构:
Kim, Jae Hyun
Tae, Heung-Sik
论文数: 0引用数: 0
h-index: 0
机构:
Kyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
Tae, Heung-Sik
Kim, Bo-Sung
论文数: 0引用数: 0
h-index: 0
机构:
Kyungpook Natl Univ, Display Nanomat Res Ctr, Taegu 702701, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
Kim, Bo-Sung
Jung, Eun Young
论文数: 0引用数: 0
h-index: 0
机构:
Samsung SDI Co Ltd, Corp R&D Ctr, Core Technol Lab, Cheonan 330300, Chungcheongnam, South KoreaKyungpook Natl Univ, Sch Elect Engn, Coll IT Engn, Taegu 702701, South Korea
机构:
Osaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Panasonic Corp, Device Dev Grp 3, AVC Devices Dev Ctr, AVC Networks Co, Osaka 5670026, Japan
Osaka Univ, Cooperat Lab Panasonic, Suita, Osaka 5650871, JapanOsaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Yoshino, Kyohei
Nagatomi, Takaharu
论文数: 0引用数: 0
h-index: 0
机构:
Osaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Osaka Univ, Cooperat Lab Panasonic, Suita, Osaka 5650871, JapanOsaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Nagatomi, Takaharu
Morita, Yukihiro
论文数: 0引用数: 0
h-index: 0
机构:
Panasonic Corp, Device Dev Grp 3, AVC Devices Dev Ctr, AVC Networks Co, Osaka 5670026, Japan
Osaka Univ, Cooperat Lab Panasonic, Suita, Osaka 5650871, JapanOsaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Morita, Yukihiro
Oue, Toshiyasu
论文数: 0引用数: 0
h-index: 0
机构:
Panasonic Corp, Device Dev Grp 3, AVC Devices Dev Ctr, AVC Networks Co, Osaka 5670026, JapanOsaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Oue, Toshiyasu
Kosugi, Naoki
论文数: 0引用数: 0
h-index: 0
机构:
Panasonic Corp, Device Dev Grp 3, AVC Devices Dev Ctr, AVC Networks Co, Osaka 5670026, JapanOsaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Kosugi, Naoki
Nishitani, Mikihiko
论文数: 0引用数: 0
h-index: 0
机构:
Osaka Univ, Cooperat Lab Panasonic, Suita, Osaka 5650871, Japan
Panasonic Corp, Adv Display Technol Grp, Image Devices Dev Ctr, Osaka 5708501, JapanOsaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Nishitani, Mikihiko
Kitagawa, Masatoshi
论文数: 0引用数: 0
h-index: 0
机构:
Panasonic Corp, Device Dev Grp 3, AVC Devices Dev Ctr, AVC Networks Co, Osaka 5670026, JapanOsaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan
Kitagawa, Masatoshi
Takai, Yoshizo
论文数: 0引用数: 0
h-index: 0
机构:
Osaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, JapanOsaka Univ, Dept Mat & Life Sci, Grad Sch Engn, Suita, Osaka 5650871, Japan