Optically scanning electric field probe system

被引：0

作者：

Suzuki, E ^{[1
]}

Arakawa, S ^{[1
]}

Ota, H ^{[1
]}

Arai, KI ^{[1
]}

Sato, R ^{[1
]}

机构：

[1] Natl Inst Informat & Commun Technol, Sendai EMC Res Ctr, Sendai, Miyagi, Japan

来源：

2004 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD 1-3 | 2004年

关键词：

probe; electro-optic crystal; Pockels effect; electromagnetic near-fields; galvano scanner;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We present an optically scanning electric field probe system designed to provide high-speed measurements of electric field distributions near PCB or LSI chips with high spatial resolution up to the gigahertz range. The optical probe system uses an electro-optic crystal and a scanned laser beam for high-speed measurements. The probe provides measurement speed of 0.1 seconds per point. We examined probe characteristics of frequency response, linearity, minimum detectable field strength, and spatial resolution up to 10 GHz.

引用

页码：182 / 185

页数：4

共 8 条

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[4] Suzuki E, 2003, 2003 IEEE SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SYMPOSIUM RECORD, VOLS 1 AND 2, P442
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[8] YAMAZAKI E, 2003, IEICE T ELECT C, V86

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