A self-assembled graphene nanomask for the epitaxial growth of nonplanar and planar GaN

被引:7
|
作者
Xu, Yu [1 ,2 ]
Cao, Bing [3 ,4 ,5 ,6 ]
Li, Zongyao [2 ]
Zheng, Shunan [1 ]
Cai, Demin [2 ]
Wang, Mingyue [1 ,2 ]
Zhang, Yumin [1 ,2 ]
Wang, Jianfeng [1 ,2 ]
Wang, Chinhua [3 ,4 ,5 ,6 ]
Xu, Ke [1 ,2 ]
机构
[1] Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion SINANO, Suzhou 215123, Peoples R China
[2] Suzhou Nanowin Sci & Technol Co Ltd, Suzhou 215123, Peoples R China
[3] Soochow Univ, Sch Optoelect Sci & Engn, Suzhou 215006, Peoples R China
[4] Soochow Univ, Collaborat Innovat Ctr Suzhou Nano Sci & Technol, Suzhou 215006, Peoples R China
[5] Soochow Univ, Educ Minist China, Key Lab Adv Opt Mfg Technol Jiangsu Prov, Suzhou 215006, Peoples R China
[6] Soochow Univ, Educ Minist China, Key Lab Modern Opt Technol, Suzhou 215006, Peoples R China
来源
CRYSTENGCOMM | 2019年 / 21卷 / 40期
基金
中国国家自然科学基金; 国家重点研发计划;
关键词
LIGHT-EMITTING-DIODES; NANOSTRUCTURES; NANOWIRES; NANORODS; ZNO;
D O I
10.1039/c9ce00970a
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Due to the unique properties of two-dimensional (2D) materials, van der Waals epitaxy or the remote epitaxy of nonplanar and planar materials on 2D materials plays an important role in various applications; however, it is often limited by low crystal quality due to misorientation in nonplanar materials or grain boundaries and high threading dislocation densities in planar materials. Selective area growth (SAG), in which orientations are concordant, grain boundaries can be avoided, and threading dislocations can be annihilated, is an effective way to overcome this limitation. It is believed that microscale materials are the predominant masks for SAG, and the nanoselective area growth (NSAG) technology is superior to SAG as it can allow the mechanical exfoliation of the epilayer from the substrate. Herein, we demonstrated the fabrication of architectural GaN nanostructures by the self-assembly NSAG (SNSAG) technology using multilayer graphene (MLG) as a nanomask. The microstructure and optical properties were characterized by scanning electron microscopy, transmission electron microscopy, cathodoluminescence, and micro-Raman and micro-photoluminescence spectroscopy techniques for evidencing the high-quality GaN nanostructures; moreover, high-quality, stress-relaxation GaN films were grown by SNSAG on MLG/SiC and mechanically exfoliated from the substrate for obtaining free-standing GaN. This technique enables the integration of any nonplanar and planar semiconductor material with graphene for extensible applications.
引用
收藏
页码:6109 / 6117
页数:9
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