Early Stage Growth Structure and Stress Relaxation of CoCrPt Thin Films on Spherically Modulated Polymer Surface

被引：0

作者：

Kim, Sarah ^{[3
]}

Jeong, Jun-Ho ^{[3
]}

Shin, Sung-Chul ^{[4
,5
]}

Son, Vo Thanh ^{[1
,2
]}

Jeon, Bo-Geon ^{[1
,2
]}

Kim, CheolGi ^{[1
,2
]}

Jeong, Jong-Ryul ^{[1
,2
]}

机构：

[1] Chungnam Natl Univ, Dept Mat Sci & Engn, Taejon 305764, South Korea

[2] Chungnam Natl Univ, Sch Green Energy Technol, Taejon 305764, South Korea

[3] Korea Inst Machinery & Mat, Nanomech Syst Res Ctr, Taejon 305343, South Korea

[4] Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea

[5] Korea Adv Inst Sci & Technol, Ctr Nanospin Spintron Mat, Taejon 305701, South Korea

来源：

JOURNAL OF MAGNETICS | 2010年 / 15卷 / 01期

关键词：

stress; CoCrPt; interface; diblock copolymer; MAGNETIC-PROPERTIES; CO FILMS; ROUGHNESS; ANISOTROPY; EVOLUTION;

D O I：

10.4283/JMAG.2010.15.1.012

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Combined study of in-situ stress measurements and atomic force microscopy (AFM) revealed drastic stress relaxation in the CoCrPt and PS(styrene)-PVP(vinyl pyridine) polymer hybrid structure that was closely related to the growth structure of the film. We have observed not only no large initial growth stress at the initial stages of film growth but also twice smaller stress in magnitude with opposite sign in the CoCrPt/PS-PVP/Si sample. The microstructural studies using AFM at the various film growth stages revealed that the film growth structure plays an important role in the stress relaxation mechanism of CoCrPt films on a corrugated polymer surface.

引用

页码：12 / 16

页数：5