Quasi-Static Terminal-Charge Model for Symmetric Double-Gate Ferroelectric FETs

被引:3
作者
Reddy, Mulaka Haranadha [1 ]
Jandhyala, Srivatsava [1 ]
机构
[1] Int Inst Informat Technol Hyderabad, Ctr VLSI Design & Embedded Syst Technol, Hyderabad 500032, Andhra Pradesh, India
关键词
Charge linearization; compact modeling; negative capacitance (NC); symmetric double-gate ferroelectric FET (SDG-FeFET); terminal charges; NEGATIVE CAPACITANCE;
D O I
10.1109/TED.2016.2519761
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Symmetric double-gate ferroelectric FETs (SDG-FeFETs) have better short-channel electrical behavior and hold promise in reducing the subthreshold swing below the classical Boltzmann's limit. Surface potential and drain current models for SDG-FeFETs have already been published in the literature. In this paper, we derive the quasi-static terminal-charge models for these devices, which can be seamlessly integrated into standard circuit simulators using the Verilog-A interface. The terminal-charge models proposed are shown to match very well with exact numerical integration of Ward-Dutton terminal-charge integrals, for all bias conditions. Core compact model for the SDG-FeFET is implemented in a SPICE circuit simulator, and the simulation of different circuits built using SDG-FeFET transistors shows improvement in their switching behavior.
引用
收藏
页码:940 / 945
页数:6
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