ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization

被引：7

作者：

Choi, Chang Min ^{[1
]}

Lee, Sang Ju ^{[1
]}

Baek, Ji Young ^{[1
]}

Kim, Jeong Jin ^{[1
]}

Choi, Myoung Choul ^{[1
]}

机构：

[1] Korea Basic Sci Inst, Mass Spectrometry & Adv Instrumentat Res Grp, Div Sci Instrumentat, Cheongju, South Korea

来源：

APPLIED SURFACE SCIENCE | 2018年 / 458卷

关键词：

ToF-SIMS; Toluene clusters; Multiphoton ionization; Rhodamine; 6G; MASS-SPECTROMETRY; TIME; ARGON; YIELDS; BRAIN; IDENTIFICATION; BOMBARDMENT; C-60(+); SYSTEMS; CELLS;

D O I：

10.1016/j.apsusc.2018.07.157

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Secondary ion mass spectrometry (SIMS) has become a powerful tool for a chemical imaging of surfaces. In particular, cluster ion beams have been widely implemented with SIMS using spatial distributions of molecules as an analysis and imaging method for a sample composed of organic molecules. In this study, we developed a home-built time-of-flight (ToF)-SIMS instrument and generated organic molecular cluster ion beams ionized by multiphoton ionization (MPI) as a primary ion beam. Further, the sample stage loaded with rhodamine 6G was bombarded with size-controlled toluene cluster ions to produce secondary ions. Mass spectra of rhodamine 6G were acquired as a function of the size of toluene cluster ions. We plotted the fragments-to-parent ion ratio against each size of cluster ion, and we found that an intact rhodamine 6G signal would be observed with less fragmentations using (Tol)(n) (> 18)+. We expect this combination of the organic molecular cluster ion beam generated by MPI and ToF-SIMS to greatly expand the field of surface analysis.

引用

页码：805 / 809

页数：5

共 39 条

[1] Improved Molecular Imaging in Rodent Brain with Time-of-Flight-Secondary Ion Mass Spectrometry Using Gas Cluster Ion Beams and Reactive Vapor Exposure [J].