Strain and strain rate measurement during the bulge test by electronic speckle pattern interferometry

被引：24
|
作者：
Montay, G.
Francois, M.
Tourneix, M.
Guelorget, B.
Vial-Edwards, C.
Lira, I.
机构：
[1] Univ Technol Troyes, Lab Syst Mecan & Ingn Simultanee, CNRS, FRE 2719,LASMIS, F-10010 Troyes, France
[2] Pontificia Univ Catolica Chile, Dept Mech & Met Engn, Santiago 4860, Chile
来源：
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY | 2007年 / 184卷 / 1-3期
关键词：
localization; plastic strain; strain rate; diffuse and localized necking; ESPI; bulge test;
D O I：
10.1016/j.jmatprotec.2006.12.013
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This paper presents a new experimental method to measure the strain increment and the strain rate during the bulge of a copper sheet. The electronic speckle pattern interferometry (ESPI) is combined with the bulge test to measure the field of strain increment. The strain rate is used to detect heterogeneity in the strain distribution. The main originality of this work is the application of an optical interferometer to determine the field of plastic strain increments and strain rates in the region of the top of the specimen. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码：428 / 435
页数：8
相关论文
共 50 条
  • [1] Strain localization band width evolution by electronic speckle pattern interferometry strain rate measurement
    Guelorget, Bruno
    Francois, Manuel
    Montay, Guillaume
    SCRIPTA MATERIALIA, 2009, 60 (08) : 647 - 650
  • [2] Strain rate measurement by Electronic Speckle Pattern Interferometry:: A new look at the strain localization onset
    Guelorget, B
    François, M
    Vial-Edwards, C
    Montay, G
    Daniel, L
    Lu, J
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2006, 415 (1-2): : 234 - 241
  • [3] Measurement of in plane strain with shearography and electronic speckle pattern interferometry
    Martinez, Amalia
    Rayas, J. A.
    Cordero, Raul
    OPTICAL MEASUREMENT TECHNIQUES FOR STRUCTURES AND SYSTEMS, 2009, : 217 - +
  • [4] Comparative measurement of in plane strain by shearography and electronic speckle pattern interferometry
    Martinez, A.
    Rayas, J. A.
    Cordero, R.
    Labbe, F.
    REVISTA MEXICANA DE FISICA, 2011, 57 (06) : 518 - 523
  • [5] Strain-rate measurements by electronic speckle-pattern interferometry (ESPI)
    Labbe, F.
    OPTICS AND LASERS IN ENGINEERING, 2007, 45 (08) : 827 - 833
  • [6] Measurement of creep strain in polymers by means of electronic speckle pattern shearing interferometry
    Benito Pascual-Francisco, Juan
    Susarrey-Huerta, Orlando
    Michtchenko, Alexandre
    Barragan-Perez, Omar
    DIMENSIONAL OPTICAL METROLOGY AND INSPECTION FOR PRACTICAL APPLICATIONS VII, 2018, 10667
  • [7] Analysis of plastic strain localization by a combination of the speckle interferometry with the bulge test
    Montay, G.
    Francois, M.
    Tourneix, M.
    Guelorget, B.
    Vial-Edwards, C.
    Lira, I.
    OPTICS AND LASERS IN ENGINEERING, 2007, 45 (01) : 222 - 228
  • [8] Measurement of in-plane strain with shearography and electronic speckle pattern interferometry for composite materials
    Martinez-Garcia, Amalia
    Rayas-Alvarez, Juan-Antonio
    Cordero, Raul
    PROCEEDINGS OF 2014 INTERNATIONAL SYMPOSIUM ON OPTOMECHATRONIC TECHNOLOGIES (ISOT), 2014, : 187 - 191
  • [9] Strain/stress measurements using electronic speckle pattern interferometry
    Pfeifer, T
    Mischo, T
    Ettemeyer, A
    Wang, Z
    Wegner, R
    THREE-DIMENSIONAL IMAGING, OPTICAL METROLOGY, AND INSPECTION IV, 1998, 3520 : 262 - 271
  • [10] Strain measurement by three-dimensional electronic speckle pattern interferometry: potentials, limitations, and applications
    Yang, LX
    Ettemeyer, A
    OPTICAL ENGINEERING, 2003, 42 (05) : 1257 - 1266
12345