A study of vacancy-related defects in (Pb,La)(Zr,Ti)O3 thin films using positron annihilation

被引:6
作者
Friessnegg, T [1 ]
Aggarwal, S
Nielsen, B
Ramesh, R
Keeble, DJ
Poindexter, EH
机构
[1] Univ Maryland, College Pk, MD 20742 USA
[2] Brookhaven Natl Lab, Upton, NY 11793 USA
[3] Univ Dundee, Dundee DD1 4HN, Scotland
[4] USA, Res Lab, Adelphi, MD 20783 USA
关键词
D O I
10.1109/58.852074
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
The formation of vacancy-type defects in La-doped lead zirconate titanate (PLZT) thin films (Zr/Ti=20/80) was studied as a function of lanthanum doping and after cooling in an oxygen-reduced ambient. The changes in the Doppler-broadening S parameter are consistent with the progressive introduction of Ph-vacancies upon La-doping. Cooling of PLZT thin films with 0 and 10% La doping in 10(-5) Torr oxygen partial pressure after growth exhibits an increase in the density of vacancy-type defects compared to films cooled in 760 Torr. It is proposed that the defects formed are likely cation-oxygen vacancy complexes.
引用
收藏
页码:916 / 920
页数:5
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