Single-electron multiple-valued memory using ultra-small floating gate metal-oxide-semiconductor field effect transistor

被引:0
作者
Ou, XB [1 ]
Wu, NJ [1 ]
机构
[1] Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2004年 / 43卷 / 10B期
关键词
single-electron; multiple-valued memory; nano-crystal grain; quantum dots; floating gate; MOS;
D O I
10.1143/JJAP.43.L1359
中图分类号
O59 [应用物理学];
学科分类号
摘要
This paper proposes a novel single-electron multiple-valued memory. It is a metal-oxide-semiconductor field effect transistor (MOS)-type memory with multiple separate control gates and floating gate layer, which consists of nano-crystal grains. The electron can tunnel among the grains (floating gates) and between the floating gate layer and the MOS channel. The memory can realize operations of 'write', 'store' and 'erase' of multiple-valued signals exceeding three values by controlling the single electron tunneling behavior. We use Monte Carlo method to simulate the operation of single-electron four-valued memory. The simulation results show that it can operate well at room temperature.
引用
收藏
页码:L1359 / L1361
页数:3
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