Input Stimulus Comparison using an Adaptive FPGA-based Testing System

被引：0

作者：

Sotirios, Pouros P. ^{[1
]}

Vassilios, Vassios D. ^{[1
]}

Dimitrios, Papakostas K. ^{[1
]}

Alkis, Hatzopoulos A. ^{[2
]}

机构：

[1] Alexander Technol & Educ Inst Thessaloniki, Dept Elect Engn TE, Thessaloniki, Greece

[2] Aristotle Univ Thessaloniki, Dept Elect & Comp Engn, Thessaloniki, Greece

来源：

2014 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) | 2014年

关键词：

component; Fault Detection; Input Stimulus Selection; External Testing System; SUPPLY CURRENT; ANALOG;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper the comparison of input stimulus signals using an adaptive FPGA-based testing system based on a method utilising wavelet transformation of the current waveforms is presented. The testing scheme is innovative because it offers the ability of applying different input stimulus signals with respect to the requirements of the examined circuit. Moreover, the method used is simple, offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results arepresented showing the effectiveness of the proposed testing scheme.

引用

页码：277 / 280

页数：4

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