Depth profiling of coated metallic artifacts adopting laser-induced breakdown spectrometry

被引:46
作者
Abdelhamid, M. [1 ]
Grassini, S. [2 ]
Angelini, E. [2 ]
Ingo, G. M. [3 ]
Harith, M. A. [1 ]
机构
[1] Cairo Univ, Natl Inst Laser Enhanced Sci, Giza, Egypt
[2] Politecn Torino, Dipartimento Sci Mat & Ingn Chim, Turin, Italy
[3] CNR, Ist Studio Mat Nanostrutturati, Rome, Italy
关键词
Laser-induced breakdown spectroscopy; Depth profiling; Coated metallic artifacts; INDUCED PLASMA; SPECTROSCOPY; LAYER;
D O I
10.1016/j.sab.2010.03.017
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Laser-induced breakdown spectroscopy (LIBS) is a relatively novel technique that is being applied to the characterization of interfaces in layered materials as an alternative to other classic surface analytical techniques. In the present work the change of laser irradiance (W/cm(2)) by changing the working distance (WD), which is the difference between the lens-to-sample distance and the focal length of the lens, has been found to be a very critical parameter. The effect of changing WD on the intersection point, the average ablation rate and the crater depth of Au and Ag thin films onto Cu substrates has been studied by using 50 mJ, Nd:YAG laser pulses. The experimental findings obtained, particularly interesting for cultural heritage field-applications, show that lowering the irradiance, the average ablation rate decreases and depth of the crater becomes less. Moreover the possibility of employing relatively high energy laser pulses for depth profiling analysis has been demonstrated. The technique has been applied on a gold coated archeological decorative copper object and reasonable results have been obtained. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:695 / 701
页数:7
相关论文
共 24 条
[1]  
ANGELINI E, 2005, P 17 INT S PLASM CHE, P1
[2]  
Angelopoulou E, 2007, IEEE I CONF COMP VIS, P2104
[3]  
[Anonymous], 2006, Handbook of Laser-Induced Breakdown Spectroscopy
[4]  
Beamson G., 1994, SURF SCI SPECTRA, V3, P366, DOI DOI 10.1116/1.1247789
[5]   Functional group identification in scanning tunneling microscopy of molecular adsorbates [J].
Cyr, DM ;
Venkataraman, B ;
Flynn, GW ;
Black, A ;
Whitesides, GM .
JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (32) :13747-13759
[6]   Auger Lineshape analysis of porous silicon: Experiment and theory [J].
Dorigoni, L ;
Pavesi, L ;
Bisi, O ;
Calliari, L ;
Anderle, M ;
Ossicini, S .
THIN SOLID FILMS, 1996, 276 (1-2) :244-247
[7]   Temporal follow up of the LTE conditions in aluminum laser induced plasma at different laser energies [J].
Galmed, A. H. ;
Harith, M. A. .
APPLIED PHYSICS B-LASERS AND OPTICS, 2008, 91 (3-4) :651-660
[8]   Angle-resolved laser-induced breakdown spectrometry for depth profiling of coated materials [J].
García, CC ;
Corral, M ;
Vadillo, JM ;
Laserna, JJ .
APPLIED SPECTROSCOPY, 2000, 54 (07) :1027-1031
[9]   MEASURING THE STRUCTURE OF ETCHED SILICON SURFACES WITH RAMAN-SPECTROSCOPY [J].
HINES, MA ;
CHABAL, YJ ;
HARRIS, TD ;
HARRIS, AL .
JOURNAL OF CHEMICAL PHYSICS, 1994, 101 (09) :8055-8072
[10]   Electrochemically controlled adhesion in atomic force spectroscopy [J].
Hudson, JE ;
Abruna, HD .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1996, 118 (26) :6303-6304