Sensing properties of surface plasmon resonance in different multilayer Si-based structures

被引：0

作者：

Patskovsky, S ^{[1
]}

Kabashin, AV ^{[1
]}

Meunier, M ^{[1
]}

机构：

[1] Ecole Polytech, Laser Proc Lab, Dept Gen Phys, Montreal, PQ H3C 3A7, Canada

来源：

APPLICATIONS OF PHOTONIC TECHNOLOGY, CLOSING THE GAP BETWEEN THEORY, DEVELOPMENT, AND APPLICATION, PT 1 AND 2 | 2004年 / 5577卷

关键词：

surface plasmon resonance; silicon; dispersion; infrared; protein adsorption;

D O I：

10.1117/12.567689

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The progress in the development of Si-based Surface Plasmon Resonance sensing technology is reported. This technology uses multi-layer structures with a gold film and a silicon prism in the Kretschmann-Raether geometry and makes potentially possible the miniaturization and integration of the sensor device on a silicon-based microplatform. We show conditions of the simultaneous excitation for two plasmon polariton modes over both sides of the gold film using different intermediate layers, between the high-refractive index silicon prism and the gold, and examine their response in configurations of the conventional and nanoparticle-enhanced sensing. The system has been calibrated in real - time measurements of protein (Concanavalin A) adsorption.

引用

页码：467 / 473

页数：7

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