Neural network models of eddy current multi-frequency system for nondestructive testing

被引：0

作者：

Chady, T

Enokizono, M

Sikora, R

机构：

[1] Oita Ind Res Inst, Oita 87011, Japan

[2] Oita Univ, Fac Engn, Oita 8701192, Japan

[3] Tech Univ Szczecin, PL-70310 Szczecin, Poland

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2000年 / 36卷 / 04期

关键词：

eddy current testing; flaw reconstruction; inverse problems; neural networks;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The purpose of this paper is to present new neural network models used for eddy current multi-frequency system simulation and flaws identification. Forward dynamic neural network models are proposed as the solution of this problem. The extended experimental verification of the developed technique is done and the results confirming usability of the models are presented.

引用

页码：1724 / 1727

页数：4

共 6 条

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[2]

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[5] Eddy-current testing by flexible microloop magnetic sensor array [J].

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[6]

Zaoui F, 1999, STUD APPL ELECTROMAG, V15, P89

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