Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans

被引:3
作者
dos Santos, Adenilson O. [1 ]
Lang, Rossan [2 ]
Sasaki, Jose M. [3 ]
Cardoso, Lisandro P. [4 ]
机构
[1] Univ Fed Maranhao UFMA, CCSST, BR-65900000 Imperatriz, MA, Brazil
[2] Univ Fed Sao Paulo UNIFESP, ICT, 330 Talim, BR-12231280 Sao Jose Dos Campos, SP, Brazil
[3] Univ Fed Ceara, Dept Fis, Campus Pici 922, BR-60455760 Fortaleza, Ceara, Brazil
[4] Univ Estadual Campinas, UNICAMP, Inst Fis Gleb Wataghin, BR-13083859 Campinas, SP, Brazil
基金
巴西圣保罗研究基金会;
关键词
Renninger scanning; X-ray multiple diffraction; thermal expansion coefficients; phase transitions; Rochelle salt; DIFFRACTION; STRAIN; CRYSTALS;
D O I
10.1107/S1600576719011944
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
This paper reports the successful extension of the basis of the X-ray multiple diffraction phenomenon in the assessment of structural phase transitions and the determination of thermal expansion coefficients along three crystallographic directions, using synchrotron radiation Renninger scans. Suitable simultaneous four-beam cases have accurately resolved the lattice-parameter variation in a nearly perfect single-crystal Rochelle salt using a high-stability temperature apparatus. Secondary reflections observed in the Renninger patterns, chosen by their sensitivity to the shifts in angular position as a function of temperature, have allowed the detection of a monoclinic to orthorhombic phase transition, as well as subtle expansions of all the basic lattice parameters, i.e. without having to carry out measurements on each crystal axis. The thermal expansion coefficients have been estimated from the linear fit of the temperature dependence of the lattice parameters, and are in agreement with those reported in the literature.
引用
收藏
页码:1271 / 1279
页数:9
相关论文
共 33 条
  • [1] [Anonymous], 2004, SOLID STATE SCI SERI
  • [2] Piezoelectric coefficients of mNA organic nonlinear optical material using synchrotron X-ray multiple diffraction
    Avanci, LH
    Cardoso, LP
    Girdwood, SE
    Pugh, D
    Sherwood, JN
    Roberts, KJ
    [J]. PHYSICAL REVIEW LETTERS, 1998, 81 (24) : 5426 - 5429
  • [3] Synchrotron-radiation x-ray multiple diffraction applied to the study of electric-field-induced strain in an organic nonlinear optical material
    Avanci, LH
    Cardoso, LP
    Sasaki, JM
    Girdwood, SE
    Roberts, KJ
    Pugh, D
    Sherwood, JN
    [J]. PHYSICAL REVIEW B, 2000, 61 (10) : 6507 - 6514
  • [4] BERGMANN J, 2002, ACTA CRYSTALLOGR A, V58, pC24
  • [5] Cady W. G, 1964, PIEZOELETRICITY INTR, V1-2
  • [6] Experimental evidence of transition between dynamical and kinematical diffraction regimes in ion-implanted Si observed through X-ray multiple-beam diffraction mappings
    Calligaris, Guilherme A.
    Lang, Rossano
    Bettini, Jefferson
    dos Santos, Adenilson O.
    Cardoso, Lisandro P.
    [J]. APPLIED PHYSICS LETTERS, 2016, 109 (14)
  • [7] SIMULTANEOUS DIFFRACTION - INDEXING UMWEGANREGUNG PEAKS IN SIMPLE CASES
    COLE, H
    CHAMBERS, FW
    DUNN, HM
    [J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (FEB): : 138 - &
  • [8] Direct Observation of Tetragonal Distortion in Epitaxial Structures through Secondary Peak Split in a Synchrotron Radiation Renninger Scan
    de Menezes, Alan S.
    dos Santos, Adenilson O.
    Almeida, Juliana M. A.
    Bortoleto, Jose R. R.
    Cotta, Monica A.
    Morelhao, Sergio L.
    Cardoso, Lisandro P.
    [J]. CRYSTAL GROWTH & DESIGN, 2010, 10 (08) : 3436 - 3441
  • [9] Growth and capping of InAs/GaAs quantum dots investigated by x-ray Bragg-surface diffraction
    Freitas, Raul O.
    Quivy, Alain A.
    Morelhao, Sergio L.
    [J]. JOURNAL OF APPLIED PHYSICS, 2009, 105 (03)
  • [10] HO CY, 1998, CINDAS DATA SERIES M, V1