Wavelength-dispersive double flat-crystal analyzer for inelastic X-ray scattering

被引：3

作者：

Bortel, G ^{[1
]}

Alp, EE ^{[1
]}

Sturhahn, W ^{[1
]}

Toellner, TS ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2000年 / 7卷

关键词：

X-ray optics; crystal analyzers; resonant/anomalous inelastic X-ray scattering; absorption edges; electronic and vibrational excitations; parallel data collection;

D O I：

10.1107/S090904950000950X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A double flat-crystal analyzer for inelastic X-ray scattering is described. The general correlation between the energy and direction of the X-rays transmitted by the analyzer allows one to collect data for a range of energy transfers simultaneously. Such an analyzer with 120 meV resolution was built to operate at the copper K edge. Experimental results show that this X-ray optic can be an alternative to a conventional spherical-focusing backscattering analyzer in resonant inelastic X-ray scattering experiments or when flexible energy resolution or high momentum resolution is required.

引用

页码：333 / 339

页数：7

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