Study of the adhesion between a-CH films and TA6V substrates by electron-induced X-ray emission spectroscopy (EXES)

被引：6

作者：

Jonnard, P ^{[1
]}

Tixier, C ^{[1
]}

Desmaison, J ^{[1
]}

Hombourger, C ^{[1
]}

Bonnelle, C ^{[1
]}

机构：

[1] UNIV LIMOGES,LAB MAT CERAM & TRAITEMENTS SURFACE,URA 320,F-87060 LIMOGES,FRANCE

来源：

THIN SOLID FILMS | 1997年 / 306卷 / 01期

关键词：

carbon; coatings; interfaces; X-ray emission;

D O I：

10.1016/S0040-6090(97)00281-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The Ti 3d valence states have been analyzed by electron-induced soft X-ray emission spectroscopy (EXES) in the TA6V bulk alloy and at a-CH/TA6V and a-SiOxCyH/TA6V interfaces. These states stem from metallic titanium in both cases. In contrast, EXES analysis shows that aluminum is in an oxide environment. Both aluminium compounds have a different behaviour depending on the presence of a-SiOxC(y)H in contact with the alloy. Adherence of a-CH films on the TA6V alloy can be explained from physicochemical interactions. (C) 1997 Elsevier Science S.A.

引用

页码：119 / 123

页数：5

共 23 条

[1]

BELIN E, 1996, COMMUNICATION

[2] INSTRUMENT FOR RESEARCH ON INTERFACES AND SURFACES [J].

BONNELLE, C ;

VERGAND, F ;

JONNARD, P ;

ANDRE, JM ;

STAUB, PF ;

AVILA, P ;

CHARGELEGUE, P ;

FONTAINE, MF ;

LAPORTE, D ;

PAQUIER, P ;

RINGUENET, A ;

RODRIGUEZ, B .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (11) :3466-3471

[3] SOFT-X-RAY SPECTROSCOPY AS A METHOD FOR STUDYING CHEMICAL INTERACTIONS AT DEEP INTERFACES [J].

BONNELLE, C ;

VERGAND, F .

JOURNAL DE CHIMIE PHYSIQUE ET DE PHYSICO-CHIMIE BIOLOGIQUE, 1989, 86 (06) :1293-1302

[4] X-RAY-SPECTRA OF ND-TRANSITION-METAL OXIDES - ROLE OF INNER ATOMIC NS AND NP STATES [J].

BOROVSKOY, EM ;

KONDRATENKO, AV ;

DOBRODEY, NV ;

ANISIMOV, VI .

PHYSICAL REVIEW B, 1994, 49 (20) :14147-14152

[5]

de Groot K., 1987, INTERCERAM, V4, P38

[6] A CARDIAC-VALVE ENHANCED BY PERMANENT-MAGNET [J].

DELAMARE, J ;

OLIVIERRULLIERE, E ;

YONNET, JP .

IEEE TRANSACTIONS ON MAGNETICS, 1993, 29 (06) :3346-3348

[7] A COMPARATIVE-STUDY OF O2/SIH4 AND N2O/SIH4 MIXTURES FOR SIO2 DEPOSITION IN A MICROWAVE AFTERGLOW [J].

DELPUPPO, H ;

DESMAISON, J ;

PECCOUD, L .

JOURNAL DE PHYSIQUE IV, 1993, 3 (C3) :241-246

[8]

FISHER DW, 1968, J APPL PHYS, V39, P4757

[9]

GATTI MA, 1991, BIOCERAM HUMAN BODY, P308

[10]

KAY J F, 1992, Dental Clinics of North America, V36, P1

← 1 2 3 →