共 28 条
[2]
EMBEDDED-ATOM METHOD - DERIVATION AND APPLICATION TO IMPURITIES, SURFACES, AND OTHER DEFECTS IN METALS
[J].
PHYSICAL REVIEW B,
1984, 29 (12)
:6443-6453
[3]
MESSUNG DES WIDERSTANDES DUNNER ISOLIERENDER SCHICHTEN ZWISCHEN GOLDKONTAKTEN IM BEREICH DES TUNNELEFFEKTES
[J].
ZEITSCHRIFT FUR PHYSIK,
1952, 132 (02)
:231-238
[5]
Reliability investigations on conductive adhesive joints with emphasis on the mechanics of the conduction mechanism
[J].
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES,
2000, 23 (03)
:462-469
[6]
FOILES SM, 1983, PHYS REV LETT, V50, P1285
[7]
EVALUATION OF CONTACT RESISTANCE FOR ISOTROPIC ELECTRICALLY CONDUCTIVE ADHESIVES
[J].
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING,
1995, 18 (02)
:299-304
[9]
Gilleo K., 1995, Soldering & Surface Mount Technology, P12, DOI 10.1108/eb037885
[10]
Harris P. G., 1995, Soldering & Surface Mount Technology, P19, DOI 10.1108/eb037894