The potential of ion beams for characterization of metal-organic frameworks

被引：4

作者：

Wagner, A. ^{[1
]}

Pullen, S. ^{[1
]}

Ott, S. ^{[1
]}

Primetzhofer, D. ^{[2
]}

机构：

[1] Uppsala Univ, Dept Chem, Angstrom Lab, Box 523, SE-75120 Uppsala, Sweden

[2] Uppsala Univ, Dept Phys & Astron, Angstrom Lab, Box 516, SE-75120 Uppsala, Sweden

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2016年 / 371卷

关键词：

RBS; TOF-MEIS; TOF-ERDA; Metal-organic framework; Catalyst;

D O I：

10.1016/j.nimb.2015.10.059

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Ion scattering has been employed for depth-profiling of metal organic frameworks (MOFs) to characterize the degree of post-synthetic uptake of [FeFe](mcbdt)(CO)(6) (mcbdt = 2,3-dithiolato-benzoic acid). The system investigated consisted of UiO-66 (UiO = University of Oslo) MOF thin films grown on p-type Si wavers in which a molecular proton reduction catalyst [FeFe](mcbdt)(CO)(6) was introduced by postsynthetic exchange (PSE). We have characterized samples by Rutherford Backscattering spectrometry (RBS), Time-of-Flight Elastic Recoil Detection analysis (TOF-ERDA) and by Time-of-Flight Medium Energy Ion Scattering (TOF-MEIS). The beam induced sample modification during the analysis has been characterized by Scanning Electron Microscopy (SEM). No detectable sample modification was found for RBS and TOF-MEIS whereas TOF-ERDA had a clear impact in the present experiment. Composition profiles could be obtained and indicated enrichment of catalyst and/or catalyst residual near to and at the sample surface. (C) 2015 Elsevier B.V. All rights reserved.

引用

页码：327 / 331

页数：5

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