Counterion condensation in ionic micelles as studied by a combined use of SANS and SAXS

被引：26

作者：

Aswal, VK ^{[1
]}

Goyal, PS

Amenitsch, H

Bernstorff, S

机构：

[1] Bhabha Atom Res Ctr, Div Solid State Phys, Bombay 400085, Maharashtra, India

[2] Bhabha Atom Res Ctr, Mumbai Ctr, IUC, DAEF, Bombay 400085, Maharashtra, India

[3] Austrian Acad Sci, Inst Biophys, A-8010 Graz, Austria

[4] Austrian Acad Sci, Xray Struct Res, A-8010 Graz, Austria

[5] Sincrotrone Trieste, I-34012 Trieste, Italy

来源：

PRAMANA-JOURNAL OF PHYSICS | 2004年 / 63卷 / 02期

关键词：

small-angle neutron scattering; small-angle X-ray scattering; charged micelle; counterion condensation;

D O I：

10.1007/BF02704994

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report a combined use of small-angle neutron scattering (SANS) and small-angle X-ray scattering (SAXS) to the study of counterion condensation in ionic micelles. Small-angle neutron and X-ray scattering measurements have been carried out on two surfactants cetyltrimethylammonium bromide (CTABr) and cetyltrimethylammonium chloride (CTACl), which are similar but having different counterions. SANS measurements show that CTABr surfactant forms much larger micelles than CTACl. This is explained in terms of higher condensation of Br- counterions than Cl- counterions. SAXS data on these systems suggest that the Br- counterions are condensed around the micelles over smaller thickness than those of Cl- counterions.

引用

页码：333 / 338

页数：6

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