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M-shell X-ray production cross sections of Bi induced by highly charged F ions
被引:7
作者:
Singh, Y
[1
]
Tribedi, LC
[1
]
机构:
[1] Tata Inst Fundamental Res, Bombay 400005, Maharashtra, India
来源:
关键词:
ionization;
inner shell;
M-subshells;
X-ray;
fluorescence yield;
D O I:
10.1016/S0168-583X(03)00590-1
中图分类号:
TH7 [仪器、仪表];
学科分类号:
0804 ;
080401 ;
081102 ;
摘要:
NI-shell X-ray production cross sections are reported for Bi induced by F ions in the energy range of 20-102 MeV. For a comparative study we have also used p, He, Li and C ions as projectiles at a few energies. The absolute X-ray cross sections for M-alphabeta, M-gamma lines and the total cross sections are derived. The intensity ratios, I(gamma)/I(alphabeta), of the M-gamma and M-alphabeta, and their energy shifts signifying the multiple vacancies in outer shells have also been studied. The measured cross sections are compared with the ECPSSR calculations. In case of M-gamma, the cross sections are found to be much higher than the ECPSSR predictions which is attributed to a net enhancement in the M-3-subshell fluorescence yield due to multiple vacancies in the N-subshells. (C) 2003 Elsevier Science B.V. All rights reserved.
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页码:794 / 798
页数:5
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