Inheritance and molecular mapping of genes for all-stage resistance to stripe rust in wheat cultivar N. Strampelli

被引:5
|
作者
Li, Qiang [1 ,2 ]
Hu, Maolin [1 ,2 ]
Chen, Jie [1 ,2 ]
Jing, Jinxue [1 ,2 ]
Wang, Baotong [1 ,2 ]
Zhou, Xiangchun [3 ]
机构
[1] NW A&F Univ, Coll Plant Protect, Yangling 712100, Shaanxi, Peoples R China
[2] NW A&F Univ, Shaanxi Key Lab Mol Biol Agr, Yangling 712100, Shaanxi, Peoples R China
[3] Lanzhou Commercial Coll, Inst Wheat Res, Lanzhou 730020, Gansu, Peoples R China
关键词
Puccinia striiformis f. sp tritici; monosomic analysis; molecular mapping; BULKED SEGREGANT ANALYSIS; F-SP TRITICI; PUCCINIA-STRIIFORMIS; CHROMOSOMAL LOCATION; MICROSATELLITE; MARKERS; BARLEY; IDENTIFICATION;
D O I
10.4141/CJPS09076
中图分类号
S3 [农学(农艺学)];
学科分类号
0901 ;
摘要
Li, Q., Hu, M., Chen, J., Jing, J., Wang, B. and Zhou, X. 2010. Inheritance and molecular mapping of genes for all-stage resistance to stripe rust in wheat cultivar N. Strampelli. Can. J. Plant Sci. 90: 529-536. N. Strampelli, an Italian wheat variety that has been grown in China since 1974, is still resistant to most prevalent Chinese races of Puccinia striiformis f. sp tritici in the seedling stage. To identify genes conferring all-stage resistance to stripe rust, F-1, F-2, F-3 and BC1 seedling progenies derived from the cross N. Strampelli x Mingxian 169 were inoculated with Chinese races CYR29, CYR29-mut3 and CYR31 and those from cross N. Strampelli x Chinese Spring were tested with CYR29-mut3 and CYR33 in the greenhouse. N. Strampelli possessed different recessive genes for resistance to each race. The genes were located on chromosomes 1B and 5B by monosomic analysis. Linkage maps were constructed with three SSR markers, Xgwm499. Xwmc415 and Xwmc537, for the gene on chromosome 5B conferring resistance to CYR29-mut3 (temporarily designated as YrN.S-1) with genetic distance ranging from 5.4 to 10.7cM and four SSR markers Xcfa2147, Xgwm124. Xwmc719 and Xwmc44, for the gene on chromosome 1B conferring resistance to CYR33 (temporarily designated as YrN.S-2) with genetic distance ranging from 3.2 to 10.3cM. The markers could be useful in pyramiding these resistance genes with others to develop wheat cultivars with high-level and durable resistance to stripe rust.
引用
收藏
页码:529 / 536
页数:8
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