Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO2

被引:40
作者
Kluth, P [1 ]
Johannessen, B
Giraud, V
Cheung, A
Glover, CJ
Azevedo, GD
Foran, GJ
Ridgway, MC
机构
[1] Australian Natl Univ, Dept Elect Mat Engn, Canberra, ACT 0200, Australia
[2] Australian Nucl Sci & Technol Org, Menai, NSW 2234, Australia
关键词
D O I
10.1063/1.1803619
中图分类号
O59 [应用物理学];
学科分类号
摘要
Au nanocrystals (NCs) fabricated by ion implantation into thin SiO2 and annealing were investigated by means of extended x-ray absorption fine structure (EXAFS) spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO2 matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25 Angstrom. (C) 2004 American Institute of Physics.
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页码:3561 / 3563
页数:3
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