A 130nm SiGe BiCMOS technology for mm-wave applications featuring HBT with fT/fMAX of 260/320 GHz

被引:0
作者
Candra, Panglijen [1 ]
Jain, Vibhor [1 ]
Cheng, Peng [1 ]
Pekarik, John [1 ]
Camillo-Castillo, R. [1 ]
Gray, Peter [1 ]
Kessler, Thomas [1 ]
Gambino, Jeffrey [1 ]
Dunn, James [1 ]
Harame, David [1 ]
机构
[1] IBM Technol Dev Ctr, 1000 River St, Essex Jct, VT 05452 USA
来源
2013 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM (RFIC) | 2013年
关键词
SiGe; BiCMOS; 130nm; mm-wave; HBT;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A manufacturable 130nm SiGe BiCMOS RF technology for high-performance mm-wave analog applications having a high-speed SiGe Heterojunction Bipolar Transistor (HBT) integrated into a full-featured RFCMOS is presented. The technology features a high performance (HP) SiGe HBT with f(T)/f(MAX) of 260/320 GHz, a high breakdown (HB) HBT with BVCEO of 3.5V, 130nm RF CMOS, and a full suite of passive devices. Specific device results pertaining to this BiCMOS8XP technology are discussed in this paper.
引用
收藏
页码:381 / 384
页数:4
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