Chemical state determination of molecular gallium compounds using XPS

被引：102

作者：

Bourque, Jeremy L. ^{[1
]}

Biesinger, Mark C. ^{[2
]}

Baines, Kim M. ^{[1
]}

机构：

[1] Univ Western Ontario, Dept Chem, London, ON N6A 5B7, Canada

[2] Univ Western Ontario, Surface Sci Western, London, ON N6G 0J3, Canada

来源：

DALTON TRANSACTIONS | 2016年 / 45卷 / 18期

基金：

加拿大自然科学与工程研究理事会;

关键词：

AUGER PARAMETER; CRYSTAL-STRUCTURE; OXIDATION-STATE; WAGNER PLOT; COMPLEXES; SPECTROSCOPY; METAL; REACTIVITY; CHEMISTRY; SPECTRA;

D O I：

10.1039/c6dt00771f

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

A series of molecular gallium compounds were analyzed using X-ray photoelectron spectroscopy (XPS). Specifically, the Ga 2p(3/2) and Ga 3d(5/2) photoelectron binding energies and the Ga L3M45M45 Auger electron kinetic energies of compounds with gallium in a range of assigned oxidation numbers and with different stabilizing ligands were measured. Auger parameters were calculated and used to generate multiple chemical speciation (or Wagner) plots that were subsequently used to characterize the novel gallium-cryptand[2.2.2] complexes 1-3 that possess ambiguous oxidation numbers for gallium. The results presented demonstrate the ability of widely accessible XPS instruments to experimentally determine the chemical state of gallium centers and, as a consequence, provide deeper insights into reactivity compared to assigned oxidation and valence numbers.

引用

页码：7678 / 7696

页数：19

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