Local nanoscale phase impurities are degradation sites in halide perovskites

被引:168
作者
Macpherson, Stuart [1 ]
Doherty, Tiarnan A. S. [1 ,2 ]
Winchester, Andrew J. [3 ]
Kosar, Sofiia [3 ]
Johnstone, Duncan N. [4 ]
Chiang, Yu-Hsien [1 ]
Galkowski, Krzysztof [1 ,5 ]
Anaya, Miguel [1 ,2 ]
Frohna, Kyle [1 ]
Iqbal, Affan N. [1 ,2 ]
Nagane, Satyawan [2 ]
Roose, Bart [2 ]
Andaji-Garmaroudi, Zahra [1 ]
Orr, Kieran W. P. [1 ,2 ]
Parker, Julia E. [6 ]
Midgley, Paul A. [4 ]
Dani, Keshav M. [3 ]
Stranks, Samuel D. [1 ,2 ]
机构
[1] Univ Cambridge, Dept Phys, Cavendish Lab, Cambridge, England
[2] Univ Cambridge, Dept Chem Engn & Biotechnol, Cambridge, England
[3] Grad Univ, Okinawa Inst Sci & Technol, Femtosecond Spect Unit, Onna, Japan
[4] Univ Cambridge, Dept Mat Sci & Met, Cambridge, England
[5] Nicolaus Copernicus Univ, Inst Phys, Fac Phys Astron & Informat, Torun, Poland
[6] Harwell Sci & Innovat Campus, Diamond Light Source, Harwell, Berks, England
基金
日本学术振兴会; 欧洲研究理事会; 英国工程与自然科学研究理事会; 欧盟地平线“2020”;
关键词
LEAD IODIDE; SOLAR-CELLS; EFFICIENCY; FILMS;
D O I
10.1038/s41586-022-04872-1
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Understanding the nanoscopic chemical and structural changes that drive instabilities in emerging energy materials is essential for mitigating device degradation. The power conversion efficiency of halide perovskite photovoltaic devices has reached 25.7 per cent in single-junction and 29.8 per cent in tandem perovskite/silicon cells(1,2), yet retaining such performance under continuous operation has remained elusive(3). Here we develop a multimodal microscopy toolkit to reveal that in leading formamidinium-rich perovskite absorbers, nanoscale phase impurities, including hexagonal polytype and lead iodide inclusions, are not only traps for photoexcited carriers, which themselves reduce performance(4,5), but also, through the same trapping process, are sites at which photochemical degradation of the absorber layer is seeded. We visualize illumination-induced structural changes at phase impurities associated with trap clusters, revealing that even trace amounts of these phases, otherwise undetected with bulk measurements, compromise device longevity. The type and distribution of these unwanted phase inclusions depends on the film composition and processing, with the presence of polytypes being most detrimental for film photo-stability. Importantly, we reveal that both performance losses and intrinsic degradation processes can be mitigated by modulating these defective phase impurities, and demonstrate that this requires careful tuning of local structural and chemical properties. This multimodal workflow to correlate the nanoscopic landscape of beam-sensitive energy materials will be applicable to a wide range of semiconductors for which a local picture of performance and operational stability has yet to be established.
引用
收藏
页码:294 / +
页数:11
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