Nitrogen doping efficiency during vapor phase epitaxy of 4H-SiC

被引:9
作者
Rowland, LB [1 ]
Burk, AA
Brandt, CD
机构
[1] Northrop Grumman Sci & Technol Ctr, Pittsburgh, PA 15235 USA
[2] Northrop Grumman Adv Technol Lab, Baltimore, MD 21203 USA
来源
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2 | 1998年 / 264-2卷
关键词
epitaxial growth; doping; nitrogen; vapor phase epitaxy;
D O I
10.4028/www.scientific.net/MSF.264-268.115
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This work examines the interrelationships among doping efficiency, mole fraction, and Si/C ratio for intentional doping of 4H-SiC during vapor phase epitaxy using N-2 For four Si/C ratios, the doping concentration increased linearly as a function of increasing N-2 partial pressure with a slope of 1.0 +/- 0.03. Variation of propane mole fraction while the SiH4 and N-2 mole fractions were kept constant revealed two different modes of nitrogen incorporation, corresponding to carbon-rich and silicon-rich conditions.
引用
收藏
页码:115 / 118
页数:4
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