An investigation on the phase purity of iron pyrite (FeS2) thin films obtained from the sulfurization of hematite (Fe2O3) thin films

被引：9

作者：

Srivastava, Ravi P. ^{[1
,2
]}

Ingole, Sarang ^{[1
]}

机构：

[1] Indian Inst Technol, Dept Mat Sci & Engn, Lab Photovolta & Energy Storage Mat, Kanpur 208016, Uttar Pradesh, India

[2] Thapar Inst Engn & Technol, Sch Phys & Mat Sci, Patiala 147004, Punjab, India

来源：

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING | 2020年 / 106卷

关键词：

Pyrite; Sulfurization; Secondary phases; XRD; Raman; VSM; CHEMICAL-VAPOR-DEPOSITION; ELECTRICAL-PROPERTIES; OPTICAL-PROPERTIES; MARCASITE-PYRITE; OXIDE FILMS; X-RAY; TRANSFORMATION; ELECTRODEPOSITION; TRANSPORT; MICROSTRUCTURE;

D O I：

10.1016/j.mssp.2019.104775

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Iron pyrite (FeS2) thin films were obtained by sulfurization of hematite (Fe2O3) thin films at different sulfurization temperatures (T-S) and sulfurization time (t(S)). Phase purity of sulfurized films was investigated with X-ray diffraction, Raman Spectroscopy and Vibrating sample magnetometry (VSM). Sulfurization temperature and time were found to have a complementary effect on the phase purity of pyrite films. Secondary phase formation in the pyrite films decreased with increasing sulfurization temperature or time. Pyrite films confirmed to be phase pure with XRD and Raman spectroscopy showed the presence of other phase(s) when analyzed with VSM. Merely XRD measurements were not sufficient to claim the phase purity of pyrite films.

引用

页数：7

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