Polarimetry analysis and optical contrast of Sb2S3 phase change material

被引:16
作者
Gutierrez, Yael [1 ]
Fernandez-Perez, Andrea [2 ]
Rosales, Saul A. [2 ]
Cobianu, Cornel [3 ,4 ]
Gheorghe, Marin [3 ]
Modreanu, Mircea [5 ]
Saiz, Jose M. [2 ]
Moreno, Fernando [2 ]
Losurdo, Maria [1 ]
机构
[1] CNR NANOTEC, Inst Nanotechnol, Via Orabona 4, I-70126 Bari, Italy
[2] Univ Cantabria, Dept Appl Phys, Avda Los Castros S-N, Santander 39005, Spain
[3] NANOM MEMS, G Cosbuc 9, Rasnov 505400, Romania
[4] Acad Romanian Scientists, Sci & Informat Technol Sect, Str Ilfov 3,Sect 5, Bucharest, Romania
[5] Univ Coll Cork, Tyndall Natl Inst, Cork T12 R5CP, Ireland
来源
OPTICAL MATERIALS EXPRESS | 2022年 / 12卷 / 04期
基金
欧盟地平线“2020”;
关键词
MUELLER MATRIX; THIN-FILMS; GENERALIZED ELLIPSOMETRY; ABSORBING MATERIALS; TRANSITIONS;
D O I
10.1364/OME.450781
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Phase-change materials (PCMs) are the cornerstone for the development of reconfigurable and programmable photonic devices. Sb2S3 has been recently proposed as an interesting PCM due to its low-losses in the visible and near-IR. Here, we report the use of imaging polarimetry and spectroscopic ellipsometry to reveal and directly measure the optical properties of Sb(2)S(3 )both in crystalline and amorphous states obtained upon crystallization by annealing in the air of chemical bath deposited amorphous Sb2S3. The Mueller Matrix polarimetric analysis reveals the strong anisotropy of the Sb(2)S(3)crystallites which crystallize in radial spherulitic domains in contrast to the optical isotropy of the amorphous films. A refractive index contrast of Delta n = 0.5 is demonstrated while maintaining low-losses at telecommunications C-band, i.e., lambda = 1550nm. (C) 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement
引用
收藏
页码:1531 / 1541
页数:11
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