Impact of Noise and Background on Measurement Uncertainties in Luminescence Thermometry

被引:65
作者
van Swieten, Thomas P. [1 ]
Meijerink, Andries [1 ]
Rabouw, Freddy T. [1 ]
机构
[1] Univ Utrecht, Debye Inst Nanomat Sci, NL-3584 CC Utrecht, Netherlands
关键词
luminescence thermometry; temperature uncertainty; statistics; (EM)CCD; background; absorption cross section; RESOLUTION;
D O I
10.1021/acsphotonics.2c00039
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Materials with temperature-dependent luminescence can be used as local thermometers when incorporated in, for example, a biological environment or chemical reactor. Researchers have continuously developed new materials aiming for the highest sensitivity of luminescence to temperature. Although the comparison of luminescent materials based on their temperature sensitivity is convenient, this parameter gives an incomplete description of the potential performance of the materials in applications. Here, we demonstrate how the precision of a temperature measurement with luminescent nanocrystals depends not only on the temperature sensitivity of the nanocrystals but also on their luminescence strength compared to measurement noise and background signal. After first determining the noise characteristics of our instrumentation, we show how the uncertainty of a temperature measurement can be predicted quantitatively. Our predictions match the temperature uncertainties that we extract from repeated measurements, over a wide temperature range (303-473 K), for different CCD readout settings, and for different background levels. The work presented here is the first study that incorporates all of these practical issues to accurately calculate the uncertainty of luminescent nanothermometers. This method will be important for the optimization and development of luminescent nanothermometers.
引用
收藏
页码:1366 / 1374
页数:9
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