Disilicide diffusion coating inspection by micro X-ray fluorescence Imaging

被引:7
作者
Doering, ER
Havrilla, GJ
Miller, TC
机构
[1] Rose Hulman Inst Technol, Dept Elect & Comp Engn, Terre Haute, IN 47803 USA
[2] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
基金
美国国家航空航天局;
关键词
coating; X-ray fluorescence; imaging;
D O I
10.1023/B:JONE.0000048865.96417.bc
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Space Shuttle orbiter thrusters fabricated from C-103 niobium alloy rely on a fused chromium disilicide coating as protection from high-temperature oxidation. Coating voids caused by high-temperature spalling, micrometeorite damage, or other impact damage must first be detected, and then characterized to measure the amount of remaining coating materials, since service life is directly proportional to coating thickness. Existing techniques to estimate the thickness of this diffusion layer are labor intensive, prone to error, and require contact with the coating. Alternative non-contact methods are sought that can automate the detection and characterization of coating defects. Micro X-ray fluorescence (MXRF) imaging is evaluated in this study as a potential NDE method to inspect the chromium disilicide coating. MXRF imaging, a relatively new technique to map the elemental composition of a surface, creates a high spatial resolution multispectral image that can be analyzed to detect coating voids and to quantify the remaining coating materials diffused in the alloy. Analysis of image data collected from sectioned thruster samples confirms that MXRF imaging is a viable detection and characterization method for the thruster coating inspection problem.
引用
收藏
页码:95 / 105
页数:11
相关论文
共 23 条
[1]  
BERTIN EP, 1978, INTRO XRAY SPECTROME, P351
[2]   Component selection for a compact micro-XRF spectrometer [J].
Bichlmeier, S ;
Janssens, K ;
Heckel, J ;
Gibson, D ;
Hoffmann, P ;
Ortner, HM .
X-RAY SPECTROMETRY, 2001, 30 (01) :8-14
[3]  
Chantler C. T., 2003, XRAY FORM FACTOR ATT
[4]  
CHRISTENSEN JR, 1996, APPL PHYS LETT, V69, P3745
[5]  
CRUTZEN HP, 1996, P IEEE ULTR S, P731
[6]   Monolithic polycapillary focusing optics and their applications in microbeam x-ray fluorescence [J].
Gao, N ;
Ponomarev, IY ;
Xiao, QF ;
Gibson, WM ;
Carpenter, DA .
APPLIED PHYSICS LETTERS, 1996, 69 (11) :1529-1531
[7]  
Havrilla GJ, 1997, X-RAY SPECTROM, V26, P364
[8]  
HOPPE ML, 1996, GAA22485
[9]  
MCLEMORE B, 2003, COMMUNICATION MAY
[10]   NDE of degradation of thermal barrier coating by means of impedance spectroscopy [J].
Ogawa, K ;
Minkov, D ;
Shoji, T ;
Sato, M ;
Hashimoto, H .
NDT & E INTERNATIONAL, 1999, 32 (03) :177-185