Optical-electronic simulation of a GaAs metal-semiconductor-metal (MSM) photodetectors

被引：0
|
作者：
Korner, TO [1 ]
Yoder, PD [1 ]
Bomholt, LH [1 ]
Fichtner, W [1 ]
机构：
[1] ETH ZURICH,INTEGRATED SYST LAB,CH-8092 ZURICH,SWITZERLAND
来源：
SISPAD '96 - 1996 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES | 1996年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：47 / 48
页数：2
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