Structural and ferroelectric properties of europium doped lead zirconate titanate thin films by a sol-gel method

被引:8
|
作者
Yu, YJ
Chan, HLW [1 ]
Wang, FP
Li, K
Choy, CL
Zhao, LC
机构
[1] Hong Kong Polytech Univ, Dept Appl Phys, Kowloon, Hong Kong, Peoples R China
[2] Harbin Inst Technol, Sch Mat Sci & Engn, Harbin, Peoples R China
关键词
sol-gel process; rare earth dopant; dielectrics; PZT thin films; ferroelectric properties;
D O I
10.1016/S0040-6090(02)01052-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using a sol-gel method, rare earth element europium doped lead zirconate titanate thin films with a pure perovskite structure were obtained. The effects of excess lead and pyrolyzing temperature on the crystalline structure of the thin films were investigated using X-ray diffraction. Their ferroelectric and dielectric properties were determined by P-E loop and impedance measurements. The remnant polarization is 23.5 muC/cm(2) and the coercive electric field strength is 5.5 kV/mm. The dielectric constant and the dissipation factor is approximately 950 and 0.07, respectively. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:161 / 164
页数:4
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