Test-retest reliability of tone-burst-evoked otoacoustic emissions

被引:0
作者
Chan, RH [1 ]
McPherson, B [1 ]
机构
[1] Univ Hong Kong, Prince Philip Dent Hosp, Dept Speech & Hearing Sci, Hong Kong, Hong Kong, Peoples R China
关键词
audiology; otoacoustic emission; reliability; tone-burst otoacoustic emissions;
D O I
暂无
中图分类号
R76 [耳鼻咽喉科学];
学科分类号
100213 ;
摘要
In this study, the short- and long-term test-retest reliabilities of tone-burst-evoked otoacoustic emissions (TBOAEs) with 12 different tone-burst stimuli (4 frequencies [1, 1.5, 2 and 3 kHz] at 3 stimulus levels [ approximate to 76, approximate to 67 and approximate to 55 dB peSPL]) were examined in 30 normal hearing subjects. Click-evoked and spontaneous OAEs were recorded in parallel with TBOAEs to facilitate cross-comparisons and the generalization of results. Findings for click-evoked and spontaneous OAEs were comparable with most literature data. High reliability for TBOAEs was established for high and mid stimulus levels at all frequencies tested with reference to test-retest prevalence rate, test-retest occurrence, intra-subject test-retest difference and correlation coefficient. Derived half-octave band analysis at the Frequency corresponding to the stimulus was found to reflect real TBOAE performance more reliably than broadband analysis. No significant difference between short- and long-term reliabilities was noted from all results. Similar lest-retest reliabilities for high-level TBOAEs and click-evoked OAEs was obtained, suggesting that TBOAEs could potentially contribute to clinical assessment.
引用
收藏
页码:825 / 834
页数:10
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