Jitter characteristic in resonant clock distribution

This paper presents a detailed clock jitter characteristic analysis of a fully integrated 1.5-GHz resonant clocking fabricated in 130-nm CMOS, with 57% total clock power saving, compared to the conventional clocking implemented in the same test-chip. The jitter measurement result is in good agreement with the jitter analysis. Furthermore, a jitter-suppression technique based on injection locking phenomenon has been utilized to reduce the clock jitter and to solve the jitter peaking problem. Measurements show about 50% peak-to-peak clock jitter reduction from 28.4 ps to 14.5 ps after the activation of the injection locking.