In situ visualization of thermal distortions of synchrotron radiation optics

被引:9
作者
Revesz, P. [1 ]
Kazimirov, A. [1 ]
Bazarov, I. [1 ]
机构
[1] Cornell Univ, Cornell High Energy Synchrotron Source, Wilson Lab 200L, Ithaca, NY 14850 USA
基金
美国国家科学基金会;
关键词
synchrotron radiation; high heat-load optics; heat bump; surface profile measurement; optical metrology;
D O I
10.1016/j.nima.2007.02.110
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have developed a new in situ method to measure heating-induced distortions of the surface of the first monochromator crystal exposed to high-power white synchrotron radiation beam. The method is based on recording the image of a stationary grid of dots captured by a CCD camera as reflected from the surface of a crystal with and without a heat load. The three-dimensional surface profile (heat bump) is then reconstructed from the distortions of the original pattern. In experiments performed at the CHESS A2 wiggler beam line we measured the heat bumps with the heights of up to 600 nm produced by a wiggler beam with total power in the range of 15-60 W incident on the (111) Si crystal at various angles between 3 degrees and 15 degrees. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:422 / 429
页数:8
相关论文
共 8 条
[1]  
AGRAWAL A, 2006, IN PRESS EUR C COMP
[2]   The historical development of cryogenically cooled monochromators for third-generation synchrotron radiation sources [J].
Bilderback, DH ;
Freund, AK ;
Knapp, GS ;
Mills, DM .
JOURNAL OF SYNCHROTRON RADIATION, 2000, 7 (02) :53-60
[3]   HEIGHT AND GRADIENT FROM SHADING [J].
HORN, BKP .
INTERNATIONAL JOURNAL OF COMPUTER VISION, 1990, 5 (01) :37-75
[4]   An X-ray beam position monitor based on the photoluminescence of helium gas [J].
Revesz, P ;
White, JA .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 540 (2-3) :470-479
[5]   Computation of 3D weld pool surface from the slope field and point tracking of laser beams [J].
Saeed, G ;
Lou, M ;
Zhang, YM .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2004, 15 (02) :389-403
[6]   DIRECT ANALYTICAL METHODS FOR SOLVING POISSON EQUATIONS IN COMPUTER VISION PROBLEMS [J].
SIMCHONY, T ;
CHELLAPPA, R ;
SHAO, M .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1990, 12 (05) :435-446
[7]  
Takacs P. Z., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V749, P59, DOI 10.1117/12.939842
[8]  
TAKACS PZ, P SPIE, V3447, P117