Structural and optical properties of CdTe thin films deposited using RF magnetron sputtering

被引：38

作者：

Kulkarni, Rupali ^{[1
]}

Rondiya, Sachin ^{[1
]}

Pawbake, Amit ^{[1
]}

Waykar, Ravindra ^{[1
]}

Jadhavar, Ashok ^{[1
]}

Jadkar, Vijaya ^{[1
]}

Bhorde, Ajinkya ^{[1
]}

Date, Abhijit ^{[2
]}

Pathan, Habib ^{[3
]}

Jadkar, Sandesh ^{[3
]}

机构：

[1] Savitribai Phule Pune Univ, Sch Energy Studies, Pune 411007, Maharashtra, India

[2] RMIT Univ, Sch Engn, Plenty Rd, Melbourne, Vic 3000, Australia

[3] Savitribai Phule Pune Univ, Dept Phys, Pune 411007, Maharashtra, India

来源：

1ST INTERNATIONAL CONFERENCE ON ENERGY AND POWER, ICEP2016 | 2017年 / 110卷

关键词：

CdTe; RF sputtering; Raman spectroscopy; Low angle XRD; UV-Visible spectroscopy; CADMIUM TELLURIDE; ABSORPTION-EDGE; TEMPERATURE; DEPENDENCE; THICKNESS; GROWTH; METAL;

D O I：

10.1016/j.egypro.2017.03.126

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

In this work, we have studied the influence of RF power on structural and optical properties of CdTe thin films deposited by indigenously designed locally fabricated RF magnetron sputtering. Films were analyzed by using variety of techniques such as low angle X-ray diffraction, UV-Visible spectroscopy, Raman spectroscopy etc. to study its structural and optical properties. Low angle XRD analysis showed that CdTe films are polycrystalline and has cubic structure with preferred orientation in (111) direction. Raman scattering studies revealed the presence of CdTe phase over the entire range of RF power studied. The UV-Visible spectroscopy analysis showed that the band gap decreases with increase in RF power. However, CdTe films deposited at higher RF power has optimum band gap values (1.44-1.60 eV). Such optimum band gap CdTe can be use as absorber material in CdS/CdTe and ZnO/CdTe solar cells. (C) 2017 The Authors. Published by Elsevier Ltd.

引用

页码：188 / 195

页数：8

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