Time-of-flight measurements on Schottky CdTe nuclear detectors

被引：1

作者：

Suzuki, Kazuhiko ^{[1
]}

Ichinohe, Yoshihiro ^{[1
]}

Sawada, Takayuki ^{[1
]}

Imai, Kazuaki ^{[1
]}

Seto, Satoru ^{[2
]}

机构：

[1] Hokkaido Inst Technol, Sapporo, Hokkaido 0068585, Japan

[2] Ishikawa Natl Coll Technol, Ishikawa, 9290392, Japan

来源：

PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 11, NO 7-8 | 2014年 / 11卷 / 7-8期

关键词：

CdTe; polarization; TOF; Schottky detector; RADIATION DETECTORS; POLARIZATION;

D O I：

10.1002/pssc.201300580

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Temporal evolution of the time-of-flight current waveforms of Schottky CdTe nuclear detectors as a function of the DC bias duration has been measured at several different temperatures from 278 K to 315 K to investigate the nature of the defects responsible for the polarization phenomena. Three relaxation processes with time constants from less than a second to as long as about a thousand seconds at room temperature are involved in the evolution. Based on the observed temperature dependence, we have concluded that two out of three relaxation processes are attributed to the ionization of defects at 0.54 eV and 0.6 eV. (C) 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

引用

页码：1337 / 1340

页数：4

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