Polychromatic diffraction contrast tomography

被引:33
作者
King, A. [1 ]
Reischig, P. [2 ,3 ]
Adrien, J. [4 ]
Peetermans, S. [5 ]
Ludwig, W. [4 ,6 ]
机构
[1] Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France
[2] Xnovo Technol ApS, DK-4600 Koge, Denmark
[3] Delft Univ Technol, Dept Mat Sci & Engn, NL-2628 CD Delft, Netherlands
[4] INSA Lyon, MATEIS, F-69621 Villeurbanne, France
[5] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[6] European Synchrotron Radiat Facil, F-38043 Grenoble, France
关键词
Diffraction contrast tomography; Laboratory X-rays; Neutron imaging; Polychromatic radiation; Polycrystalline characterization; HIGH-RESOLUTION; FATIGUE-CRACK; NEAR-FIELD; RAY; ORIENTATION; POLYCRYSTALS; GROWTH;
D O I
10.1016/j.matchar.2014.07.026
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This tutorial review introduces the use of polychromatic radiation for 3D grain mapping using X-ray diffraction contrast tomography. The objective is to produce a 3D map of the grain shapes and orientations within a bulk, millimeter-sized polycrystalline sample. The use of polychromatic radiation enables the standard synchrotron X-ray technique to be applied in a wider range of contexts: I) Using laboratory X-ray sources allows a much wider application of the diffraction contrast tomography technique. 2) Neutron sources allow large samples, or samples containing high Z elements to be studied. 3) Applied to synchrotron sources, smaller samples may be treated, or faster measurements may be possible. Challenges and particularities in the data acquisition and processing, and the limitations of the different variants, are discussed. (C) 2014 Elsevier Inc. All rights reserved.
引用
收藏
页码:1 / 10
页数:10
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