Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy

被引：54

作者：

Riedel, C. ^{[2
,3
,4
]}

Arinero, R. ^{[2
]}

Tordjeman, Ph ^{[1
]}

Leveque, G. ^{[2
]}

Schwartz, G. A. ^{[5
]}

Alegria, A. ^{[4
,5
]}

Colmenero, J. ^{[3
,4
,5
]}

机构：

[1] Univ Toulouse 1, CNRS, INPT, Inst Mecan Fluides IMFT, F-31400 Toulouse, France

[2] Univ Montpellier 2, CNRS, UMR 5214, IES, F-34095 Montpellier, France

[3] Donostia Int Phys Ctr, San Sebastian 20018, Spain

[4] Univ Basque Country, Fac Quim, Dept Fis Mat, EHU, E-20080 San Sebastian, Spain

[5] UPV, CSIC, Ctr Fis Mat, EHU, San Sebastian 20018, Spain

来源：

PHYSICAL REVIEW E | 2010年 / 81卷 / 01期

关键词：

TEMPERATURE; PRESSURE; TIP;

D O I：

10.1103/PhysRevE.81.010801

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

We present a simple method to quantitatively image the dielectric permittivity of soft materials at nanoscale using electrostatic force microscopy (EFM) by means of the double pass method. The EFM experiments are based on the measurement of the frequency shifts of the oscillating tip biased at two different voltages. A numerical treatment based on the equivalent charge method allows extracting the values of the dielectric permittivity at each image point. This method can be applied with no restrictions of film thickness and tip radius. This method has been applied to image the morphology and the nanodielectric properties of a model polymer blend of polystyrene and poly(vinyl acetate).

引用

页数：4

共 25 条

[1] Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions [J].