Handling of highly-moisture sensitive components - An analysis of low-humidity containment and baking schedules

被引:8
作者
Shook, RL [1 ]
Goodelle, JP [1 ]
机构
[1] Lucent Technol, Allentown, PA 18103 USA
来源
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING | 2000年 / 23卷 / 02期
关键词
baking; moisture diffusion; out-of-bag exposure; SMD's;
D O I
10.1109/6104.846930
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Unique component handling issues can arise when an assembly factory uses highly-moisture sensitive surface mount devices (SMD's). This work describes how the distribution of moisture within the molded plastic body of a SMD is an important variable for survivability. JEDEC/IPC [1] moisture level rated packages classified as Levels 4-5a are shown to require additional handling constraints beyond the typical out-of-bag exposure time tracking. Nitrogen or desiccated cabinet containment is shown as a safe and effective means for long-term storage provided the effects of prior out-of-bag exposure conditions are taken into account. Moisture diffusion analyzes coupled with experimental verification studies show that time in storage is as important a variable as floor-life exposure for highly-moisture sensitive devices, Improvements in floor-life survivability can be obtained by a handling procedure that includes cyclic storage in low humidity containment. SMD's that have exceeded their floor-life limits are analyzed for proper baking schedules. Optimized baking schedules can be adopted depending on a knowledge of the exposure conditions and the moisture sensitivity level of the device.
引用
收藏
页码:81 / 86
页数:6
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