Bending in VO2-coated microcantilevers suitable for thermally activated actuators

被引:85
作者
Rua, Armando [1 ,2 ]
Fernandez, Felix E. [1 ]
Sepulveda, Nelson [3 ]
机构
[1] Univ Puerto Rico, Dept Phys, Mayaguez, PR 00681 USA
[2] CUNY, Doctoral Program Phys, Grad Ctr, New York, NY 10016 USA
[3] Univ Puerto Rico, Dept Elect & Comp Engn, Mayaguez, PR 00681 USA
基金
美国国家科学基金会;
关键词
THIN-FILMS; VO2; TRANSITION; SILICON;
D O I
10.1063/1.3369282
中图分类号
O59 [应用物理学];
学科分类号
摘要
The curvature of VO2-coated silicon microcantilevers was measured as the temperature was cycled through the coating's insulator-to-metal transition (IMT), which drives the curvature change mainly through the strain generated during this reversible structural transformation. The films were grown by pulsed laser deposition (PLD) on heated substrates. Cantilever tip displacement was measured for a 130 mu m long cantilever as the temperature was changed by recording the deflection of a laser beam, and the curvature change and estimated film stress were calculated from this data. A change in curvature of over 2000 m(-1) was observed through the narrow temperature range of the IMT, with a maximum rate of similar to 485 m(-1) per degree. Estimated recoverable stress was similar to 1 GPa through the transition region. These results suggest applications in actuator devices with reduced dimensions, including submicron lengths, multifunctional capabilities, and possibly with higher operational frequencies than other thermally actuated devices. (C) 2010 American Institute of Physics. [doi:10.1063/1.3369282]
引用
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页数:4
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