Singular value decomposition for texture defect detection in visual inspection systems

被引:3
作者
Tomczak, L. [1 ]
Mosorov, V. [1 ]
机构
[1] Tech Univ Lodz, Comp Engn Dept, Stefanowskiego 18-22, PL-90924 Lodz, Poland
来源
PERSPECTIVE TECHNOLOGIES AND METHODS IN MEMS DESIGN | 2006年
关键词
automatic visual inspection system; texture defects detection; singular value decomposition;
D O I
10.1109/MEMSTECH.2006.288681
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper we propose an algorithm for texture defects detection, which doesn't use supervised classification. The algorithm can be simply applied in an automatic visual inspection system. For localization of texture defects we calculate features of each non-overlapping region of an image via the Singular Value Decomposition (SVD) and image processing techniques. In next step the algorithm uses the fuzzy c-means clustering (FCM) to classify each region into two clusters. Finally we define a distance between centres of defective and non-defective clusters using some threshold value chosen empirically.
引用
收藏
页码:131 / +
页数:2
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