Distributed computing in mask data preparation for 45nm node and below

被引:2
作者
Zhang, Weidong [1 ]
Sahouria, Emile [1 ]
Schulze, Steffen [2 ]
机构
[1] Mentor Graph Corp, 1001 Ridder Pk Dr, San Jose, CA 95131 USA
[2] Mentor Graph Corp, Wilsonville, OR 97070 USA
来源
PHOTOMASK TECHNOLOGY 2006, PTS 1 AND 2 | 2006年 / 6349卷
关键词
RET; MDP; DRC; OPC; parallel processing; distributed; multithreaded; scalability; Unix; Linux; TAT;
D O I
10.1117/12.685144
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Data Preparation for photomask manufacturing is characterized by computational complexity that grows faster than the evolution of computer processor ability. Parallel processing generally addresses this problem and is an accepted mechanism for preparing mask data. One judges a parallel software implementation by total time, stability and predictability of computation. We apply several fundamental techniques to dramatically improve these metrics for a parallel, distributed MDP system. This permits the rapid, predictable computation of the largest mask layouts on conventional computing clusters.
引用
收藏
页数:13
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