Local piezoelectric response in bismuth-based ferroelectric thin films investigated by scanning force microscopy

被引：12
作者：
Fu, DS [1 ]
Suzuki, K [1 ]
Kato, K [1 ]
机构：
[1] Natl Inst Adv Ind Sci & Technol, Moriyama Ku, Nagoya, Aichi 4638560, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2002年 / 41卷 / 10A期
关键词：
ferroelectric; piezoelectric; scanning force microscopy; bismuth-based ferroelectric thin film;
D O I：
10.1143/JJAP.41.L1103
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Scanning force microscopy (SFM) has been used to probe the local polarization state and piezoelectric properties of ferroelectric films. The conductive SFM tip was employed as a movable top electrode to detect the piezoresponse in the film induced by an ac voltage, Our measurements reveal a spatial dependence of the piezoelectric properties of individual grains of virgin ferroelectric films. A maximum effective piezoelectric coefficient of 5.5 pm/V has been detected in the lead-free CaBi(14)Ti(14)Oj(15) film.
引用
收藏
页码：L1103 / L1105
页数：3
相关论文
共 24 条
  • [1] Local, nonvolatile electronic writing of epitaxial Pb(Zr0.52Ti0.48)O-3/SrRuO3 heterostructures
    Ahn, CH
    Tybell, T
    Antognazza, L
    Char, K
    Hammond, RH
    Beasley, MR
    Fischer, O
    Triscone, JM
    [J]. SCIENCE, 1997, 276 (5315) : 1100 - 1103
  • [2] Patterning and switching of nanosize ferroelectric memory cells
    Alexe, M
    Harnagea, C
    Hesse, D
    Gösele, U
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (12) : 1793 - 1795
  • [3] 100-nm lateral size ferroelectric memory cells fabricated by electron-beam direct writing
    Alexe, M
    Harnagea, C
    Erfurth, W
    Hesse, D
    Gösele, U
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2000, 70 (03): : 247 - 251
  • [4] Size effect in mesoscopic epitaxial ferroelectric structures:: Increase of piezoelectric response with decreasing feature size
    Bühlmann, S
    Dwir, B
    Baborowski, J
    Muralt, P
    [J]. APPLIED PHYSICS LETTERS, 2002, 80 (17) : 3195 - 3197
  • [5] Spatial variation of ferroelectric properties in Pb(Zr0.3, Ti0.7)O3 thin films studied by atomic force microscopy
    Christman, JA
    Kim, SH
    Maiwa, H
    Maria, JP
    Rodriguez, BJ
    Kingon, AI
    Nemanich, RJ
    [J]. JOURNAL OF APPLIED PHYSICS, 2000, 87 (11) : 8031 - 8034
  • [6] Piezoelectric measurements with atomic force microscopy
    Christman, JA
    Woolcott, RR
    Kingon, AI
    Nemanich, RJ
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (26) : 3851 - 3853
  • [7] Investigations into local piezoelectric properties by atomic force microscopy
    Durkan, C
    Chu, DP
    Migliorato, P
    Welland, ME
    [J]. APPLIED PHYSICS LETTERS, 2000, 76 (03) : 366 - 368
  • [8] FU DS, UNPUB
  • [9] FU DS, 2002, IN PRESS JPN J APPL, V41
  • [10] Scaling of ferroelectric properties in thin films
    Ganpule, CS
    Stanishevsky, A
    Su, Q
    Aggarwal, S
    Melngailis, J
    Williams, E
    Ramesh, R
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (03) : 409 - 411
123