Pseudospark discharge behavior at a low charging voltage

被引：2

作者：

Arsov, Vladimir ^{[1
]}

Frank, Klaus ^{[1
]}

机构：

[1] Univ Erlangen Nurnberg, Dept Phys 1, D-91058 Erlangen, Germany

来源：

IEEE TRANSACTIONS ON PLASMA SCIENCE | 2007年 / 35卷 / 01期

关键词：

jitter; laser-induced fluorescence (LIF); Lane diagrams; metal vapor density; pseudospark;

D O I：

10.1109/TPS.2006.889296

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Evolution maps of the sputtered copper vapor in the hollow cathode and the main gap areas of two experimental pseudospark switches operating with several buffer gases are obtained with laser-induced fluorescence. The measurements aim to understand the pseudospark breakdown formation and are deliberately made at low charging voltages (1 kV) at which the interval between the trigger pulse and the pseudospark breakdown is characterized with a low current (similar to 10 A) and a long (1-5 mu s) randomly variable shot-to-shot duration. Reported are the results for prebreakdown intervals with different lengths. On the other hand, the unfavorable statistical behavior is utilized with the method of the Lane diagrams, which allow phenomenological investigation of the breakdown. In addition, spectrally integrated plasmaemission images taken with an intensified charge-coupled-device camera are represented.

引用

页码：83 / 92

页数：10

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