共 33 条
Degradation Mechanism of Interfacial Adhesion between Screen-Printed Ag/Polyimide in Temperature/Humidity Environment
被引:4
作者:

Bae, Byung-Hyun
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机构:
VITZROTECH Co Ltd, 327 Byeolmang Ro, Ansan 15603, Gyeonggi Do, South Korea VITZROTECH Co Ltd, 327 Byeolmang Ro, Ansan 15603, Gyeonggi Do, South Korea

Lee, Hyeonchul
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h-index: 0
机构:
STATS ChipPAC Korea LTD, 191 Jayumuyeok Ro, Incheon 22379, South Korea VITZROTECH Co Ltd, 327 Byeolmang Ro, Ansan 15603, Gyeonggi Do, South Korea

Kim, Gahui
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h-index: 0
机构:
Andong Natl Univ, Sch Mat Sci & Engn, 1375 Gyeongdong Ro, Andong Si 36729, Gyeongsangbuk D, South Korea VITZROTECH Co Ltd, 327 Byeolmang Ro, Ansan 15603, Gyeonggi Do, South Korea

Son, Kirak
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h-index: 0
机构:
Andong Natl Univ, Sch Mat Sci & Engn, 1375 Gyeongdong Ro, Andong Si 36729, Gyeongsangbuk D, South Korea VITZROTECH Co Ltd, 327 Byeolmang Ro, Ansan 15603, Gyeonggi Do, South Korea

Park, Young-Bae
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h-index: 0
机构:
Andong Natl Univ, Sch Mat Sci & Engn, 1375 Gyeongdong Ro, Andong Si 36729, Gyeongsangbuk D, South Korea VITZROTECH Co Ltd, 327 Byeolmang Ro, Ansan 15603, Gyeonggi Do, South Korea
机构:
[1] VITZROTECH Co Ltd, 327 Byeolmang Ro, Ansan 15603, Gyeonggi Do, South Korea
[2] STATS ChipPAC Korea LTD, 191 Jayumuyeok Ro, Incheon 22379, South Korea
[3] Andong Natl Univ, Sch Mat Sci & Engn, 1375 Gyeongdong Ro, Andong Si 36729, Gyeongsangbuk D, South Korea
关键词:
Flexible printed circuit board;
Peel test;
Temperature;
humidity;
Screen-printed ag;
Polyimide;
ELECTROLESS-PLATED NI;
AG NANOPARTICLES;
SILVER;
ENERGY;
FILM;
CONDUCTIVITY;
LITHOGRAPHY;
ALLOY;
UV;
D O I:
10.1007/s13391-021-00272-1
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
The effect of temperature/humidity (T/H) treatment at 85 celcius/85% relative humidity (R.H.) on the peel strength between screen-printed Ag/polyimide (PI) substrate was evaluated using a 180 degrees peel test. Initial peel strength was 22.22 +/- 1.00 gf/mm, and then decreased to 0.47 +/- 0.22 gf/mm after 500 h at 85 celcius/85% R.H. treatment condition. And, the peeled locus was changed from Ag/PI interface to mixed mode of Ag/PI interface and shallow cohesive inside PI near Ag/PI interface. The decrease in peel strength during T/H treatment is related to formation of weak boundary layer inside PI near Ag/PI interface by hydrolytic degradation of PI due to long-term moisture penetration into the Ag/PI interface.
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收藏
页码:157 / 163
页数:7
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